1 /* SPDX-License-Identifier: GPL-2.0+ */
2 /*
3 * Copyright (c) 2013 Google, Inc.
4 */
5
6 #ifndef __TEST_TEST_H
7 #define __TEST_TEST_H
8
9 #include <malloc.h>
10 #include <linux/bitops.h>
11
12 /*
13 * struct unit_test_state - Entire state of test system
14 *
15 * @fail_count: Number of tests that failed
16 * @start: Store the starting mallinfo when doing leak test
17 * @of_live: true to use livetree if available, false to use flattree
18 * @of_root: Record of the livetree root node (used for setting up tests)
19 * @root: Root device
20 * @testdev: Test device
21 * @force_fail_alloc: Force all memory allocs to fail
22 * @skip_post_probe: Skip uclass post-probe processing
23 * @expect_str: Temporary string used to hold expected string value
24 * @actual_str: Temporary string used to hold actual string value
25 */
26 struct unit_test_state {
27 int fail_count;
28 struct mallinfo start;
29 struct device_node *of_root;
30 bool of_live;
31 struct udevice *root;
32 struct udevice *testdev;
33 int force_fail_alloc;
34 int skip_post_probe;
35 char expect_str[256];
36 char actual_str[256];
37 };
38
39 /* Test flags for each test */
40 enum {
41 UT_TESTF_SCAN_PDATA = BIT(0), /* test needs platform data */
42 UT_TESTF_PROBE_TEST = BIT(1), /* probe test uclass */
43 UT_TESTF_SCAN_FDT = BIT(2), /* scan device tree */
44 UT_TESTF_FLAT_TREE = BIT(3), /* test needs flat DT */
45 UT_TESTF_LIVE_TREE = BIT(4), /* needs live device tree */
46 UT_TESTF_CONSOLE_REC = BIT(5), /* needs console recording */
47 /* do extra driver model init and uninit */
48 UT_TESTF_DM = BIT(6),
49 };
50
51 /**
52 * struct unit_test - Information about a unit test
53 *
54 * @name: Name of test
55 * @func: Function to call to perform test
56 * @flags: Flags indicated pre-conditions for test
57 */
58 struct unit_test {
59 const char *file;
60 const char *name;
61 int (*func)(struct unit_test_state *state);
62 int flags;
63 };
64
65 /**
66 * UNIT_TEST() - create linker generated list entry for unit a unit test
67 *
68 * The macro UNIT_TEST() is used to create a linker generated list entry. These
69 * list entries are enumerate tests that can be execute using the ut command.
70 * The list entries are used both by the implementation of the ut command as
71 * well as in a related Python test.
72 *
73 * For Python testing the subtests are collected in Python function
74 * generate_ut_subtest() by applying a regular expression to the lines of file
75 * u-boot.sym. The list entries have to follow strict naming conventions to be
76 * matched by the expression.
77 *
78 * Use UNIT_TEST(foo_test_bar, _flags, foo_test) for a test bar in test suite
79 * foo that can be executed via command 'ut foo bar' and is implemented in
80 * function foo_test_bar().
81 *
82 * @_name: concatenation of name of the test suite, "_test_", and the name
83 * of the test
84 * @_flags: an integer field that can be evaluated by the test suite
85 * implementation
86 * @_suite: name of the test suite concatenated with "_test"
87 */
88 #define UNIT_TEST(_name, _flags, _suite) \
89 ll_entry_declare(struct unit_test, _name, ut_ ## _suite) = { \
90 .file = __FILE__, \
91 .name = #_name, \
92 .flags = _flags, \
93 .func = _name, \
94 }
95
96 /* Get the start of a list of unit tests for a particular suite */
97 #define UNIT_TEST_SUITE_START(_suite) \
98 ll_entry_start(struct unit_test, ut_ ## _suite)
99 #define UNIT_TEST_SUITE_COUNT(_suite) \
100 ll_entry_count(struct unit_test, ut_ ## _suite)
101
102 /* Use ! and ~ so that all tests will be sorted between these two values */
103 #define UNIT_TEST_ALL_START() ll_entry_start(struct unit_test, ut_!)
104 #define UNIT_TEST_ALL_END() ll_entry_start(struct unit_test, ut_~)
105 #define UNIT_TEST_ALL_COUNT() (UNIT_TEST_ALL_END() - UNIT_TEST_ALL_START())
106
107 /* Sizes for devres tests */
108 enum {
109 TEST_DEVRES_SIZE = 100,
110 TEST_DEVRES_COUNT = 10,
111 TEST_DEVRES_TOTAL = TEST_DEVRES_SIZE * TEST_DEVRES_COUNT,
112
113 /* A few different sizes */
114 TEST_DEVRES_SIZE2 = 15,
115 TEST_DEVRES_SIZE3 = 37,
116 };
117
118 /**
119 * testbus_get_clear_removed() - Test function to obtain removed device
120 *
121 * This is used in testbus to find out which device was removed. Calling this
122 * function returns a pointer to the device and then clears it back to NULL, so
123 * that a future test can check it.
124 */
125 struct udevice *testbus_get_clear_removed(void);
126
arch_reset_for_test(void)127 static inline void arch_reset_for_test(void)
128 {
129 #ifdef CONFIG_SANDBOX
130 #include <asm/state.h>
131
132 state_reset_for_test(state_get_current());
133 #endif
134 }
135
136 #endif /* __TEST_TEST_H */
137